年度104
等級SCI
論文名稱Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
全部作者Tsai, Chih-Chun; Lin, Chien-Tai
卷數IEEE Transactions on Reliability 64(4), pp.1340-1355
ISSN(ISBN)0018-9529;1558-1721
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