年度101
等級SCI
論文名稱Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects
全部作者Tsai, Chih-Chun; Tseng, Sheng-Tsaing; Balakrishnan Narayanaswamy
卷數IEEE Transactions on Reliability 61(2), p. 604 - 613
ISSN(ISBN)0018-9529
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